Investigations on the Reactions of Organic Semiconductors with Reactive Metals
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The performance and functionality of (organic) electronic devices are largely determined by their interfaces. Therefore, research on their formation and modification, for example through chemical reactions at the metal/organic interface, is of crucial importance for the development of novel functional materials. Numerous studies on various organic and polymer layers have shown that penetration of metals into these layers can have positive effects on the performance but may also cause severe degradation of interfacial layers.
Porphyrin and corrole complexes are characterized by their versatile chemical tunability and are therefore considered promising organic compounds for a wide range of applications. This thesis aims to investigate two representative compounds of these classes, 5,10,15,20-tetraphenylporphyrin (H2TPP) and 2,3,8,12,17,18-hexaethyl-7,13-dimethylcorrole (H3HEDMC), with respect to their interfacial reactivity with reactive metals such as calcium and lithium. X-Ray Photoelectron Spectroscopy (XPS) and Hard X-Ray Photoelectron Spectroscopy (HAXPES) were used to clarify whether reactions
take place and to what extent the metals penetrate into the organic layers. Additionally, reaction depths from previous studies were reevaluated.
In the context of the analysis of HAXPES data obtained with synchrotron radiation, the concept of effective attenuation lengths is presented and used for quantification of overlayer thicknesses and reaction depths. It can be regarded as an extension of the concept of inelastic mean free paths, which is usually used. In this context, principles of photoemission spectroscopy are explained and theoretical relative sensitivity factors for the HIKE endstation at the synchrotron radiation facility BESSY II in Berlin are calculated and compared with experimental results. Furthermore, the determination of overlayer thick-
nesses with XPS and HAXPES is described and compared to established methods such as using quartz crystal microbalances.
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Except where otherwise noted, this item's license is described as CC BY-NC-SA 4.0