Item type:Thesis, Open Access

Mikroskopische Analyse optoelektronischer Eigenschaften von Halbleiterverstärkungsmedien für Laseranwendungen

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Philipps-Universität Marburg

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Abstract

A microscopic many-particle theory is applied to model a wide range of semiconductor laser gain materials. The fundamental understanding of the gain medium and the underlying carrier interaction processes allow for the quantitative prediction of the optoelectronic properties governing the laser performance. Detailed theory-experiment-comparisons are shown for a variety of structures demonstrating the application capabilities of the theoretical approach. The microscopically calculated material properties, in particular absorption, optical gain, luminescence and the intrinsic carrier losses due to radiative and Auger-recombination, constitute the critical input to analyse and design laser structures. On this basis, important system features such as laser wavelength or threshold behaviour become predictable. However, the theory is also used in a diagnostic fashion, e.g. to extract otherwise poorly known structural parameter. Thus, novel concepts for the optimisation of laser designs may be developed with regard to the requirements of specific applications. Moreover, the approach allows for the systematic exploration and assessment of completely novel material systems and their application potential.

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Bückers, Christina (143433520): Mikroskopische Analyse optoelektronischer Eigenschaften von Halbleiterverstärkungsmedien für Laseranwendungen. : Philipps-Universität Marburg 2011-01-20. DOI: https://doi.org/10.17192/z2011.0046.

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This item has been published with the following license: In Copyright