Item type:Doctoral Thesis, Open Access

Investigation of light-induced defects in hydrogenated amorphous silicon by low temperature annealing and pulsed degradation

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Philipps-Universität Marburg

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Heck, Stephan: Investigation of light-induced defects in hydrogenated amorphous silicon by low temperature annealing and pulsed degradation. : Philipps-Universität Marburg 2003-08-06. DOI: https://doi.org/10.17192/z2002.0408.

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This item has been published with the following license: In Copyright